DATE Save the Date 17 to 19 April 2023

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W01.3 Invited Session 2: The challenges of reaching zero defect and functional safety – and how the EDA industry tackles them

Session Start
Session End
Organiser
Riccardo Cantoro, Politecnico di Torino, Italy
Organiser
Daniel Tille, Infineon, Germany
Moderator
Daniel Tille, Infineon, Germany

Abstract: Automotive Microcontrollers have been becoming very complex System-on-Chips (SoCs). Especially the megatrends Assisted Driving (ADAS) and Automated Driving (AD), but also traditional applications such as power-train steering require ever-increasing functionality. However, these safety-critical environments require zero defect, and the implementation of functional safety measures and the rising complexity poses significant challenges to satisfy these requirements.This special session addresses these challenges and shows potential solutions to overcome them with the help of the EDA industry.

Presentations:

  • Automated solutions for safety and security vulnerabilities

Teo Cupaiuolo (Synopsys)

  • Functional Safety: an EDA perspective

Alessandra Nardi (Cadence)

  • The Zero Defect Goal For Automotive ICs

Lee Harrison (Siemens EDA); Nilanjan Mukherjee (Siemens)

Presentations

W01.3.1 Automated solutions for safety and security vulnerabilities

Start
End
Speaker
Teo Cupaiuolo, Synopsis, Italy

W01.3.2 Functional Safety: an EDA perspective

Start
End
Speaker
Alessandra Nardi, Cadence, United States

W01.3.3 The Zero Defect Goal For Automotive ICs

Start
End
Speaker
Lee Harrison, Siemens EDA, United Kingdom