DATE Save the Date 17 to 19 April 2023

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W01.4 Panel: What are the limitations of EDA tools with respect to zero defects and FuSa?

Session Start
Session End
Organiser
Davide Appello, STMicroelectronics, Italy
Moderator
Wim Dobbelaere, onsemi, Belgium
Panellist
Antonio Priore, ARM, United Kingdom
Panellist
Georges Gielen, KU Leuven, Belgium
Panellist
Chen He, NXP, United States
Panellist
Mauro Pipponzi, ELES, Italy
Panellist
Vladimir Zivkovic, Infineon, Denmark
Panellist
Om Ranjan , STMicroelectronics, India

Abstract: High quality demanding products segments like automotive, transportation, and aerospace have been characterized by persistent needs across several years:

  • Zero defects, or in general very low defective levels
  • Accurate modeling and prediction of product reliability

The sustainability of these objectives is challenged by the relentless demand of higher performances products and the consequent access to higher complexities and advanced technology nodes.
Functional safety standards and requirements aim to grant the usability of products in safety-critical applications and add several requirements whose satisfaction is a key criticality during the development of a new product.

The proposed panel session would like to debate with the experts about how much the available EDA tools are effectively helping to face the described challenges.
As an example, these are suitable questions that anyone in the field may need answering:

  • How does EDA help effectively resolve “end-to-end” the traceability of defined requirements? Is this representing a sustainable effort?
  • Is DFT effective enough in addressing fault models to reach target quality?
  • Is verification/simulation/validation effective respect transient mode?