DATE Save the Date 17 to 19 April 2023


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8.8 Industrial Design Methods and Tools: Multidimensional Design Reuse and Extended Role of Test for Automotive

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Moderator
Jürgen Haase, edacentrum GmbH, Germany

This Exhibition Workshop features two talks on industrial design methods and tools. It is open to conference delegates as well as to exhibition visitors.

Presentations

8.8.1 Earlier SoC Integration with a Multidimensional Design Reuse

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Speaker
Chouki Aktouf, Defacto Technologies, France

SoC design starts by design assembly connecting IP blocks which is just the beginning of the integration process. The difficult part is reaching the best possible PPA (Power, Performance, Area) combination within tight deadlines, while keeping engineering costs under control. In the conventional EDA (Electronic Design Automation) design flow, each task (power consumption, architecture, testing, etc.) is performed separately by an ultra-specialized team of engineers and significant design time is lost in iteration loops. The number of iterations has a great impact on the cost and time frame of the whole project.

This presentation will illustrate how to start SoC Build process much earlier compared to traditional design flows. Using a joint API handling a variety of design domains and design formats including RTL, constraints, power, physical, test, etc. Such API allows non design experts to take important design.

Also, a new dimension of design extraction is presented with a focus on “Power SoC Integration”. It is shown how the design reuse ratio is augmented by keeping engineering cost reasonably low.

8.8.2 Extending the Role of Test to meet Automotive Safety and Security Requirements

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Speaker
Lee Harrison, Siemens EDA, United Kingdom

The role of test is expanding from its traditional role into one that includes managing the entire silicon lifecycle. To ensure that ICs work safely and as expected throughout their operational life, the industry needs to expand from production test to a model that includes ongoing monitoring for defects, degradations, bugs, attacks, and use case surprises.