W01 European Automotive Reliability, Test and Safety (eARTS)
Automotive electronics is becoming more and more relevant in the daily life, especially with the advent of the autonomous driving. People will become 100% dependent on the proper operation of the electronic systems. The 2nd European Automotive Reliability, Test and Safety workshop (eARTS) intends to focus on test, reliability, and safety of automotive electronics, including IC design, test development, system-level integration, production testing, in-field test, diagnosis and repair solutions, cybersecurity, as well as architectures and methods for reliable, safe, and secure operation in the field.
The eARTS Workshop wants to offer a forum for industry specialists and academic researchers to present and discuss these challenges and emerging solutions. For this second edition in the frame of the DATE conference, special focus will be given on Design-for-Test solutions and System level test.
Topic Areas – You are invited to participate and submit your contributions to the eARTS Workshop. The workshop’s areas of interest include (but are not limited to) the following topics:
- Automotive Design-for-Test: enable high quality at low cost
- Statistical post-processing, Machine Learning, and AI for test and reliability
- Latent defect activation during production testing
- Built-In Self-Test in automotive systems: digital, analog, mixed-signal
- Reuse of test infrastructure and New Product Development acceleration
- Dependability challenges of autonomous driving and e-mobility
- Functional safety and cyber-security
- Automotive standards and certification – ISO 26262, AEC-Q100
- Approximate computing for automotive
- Verification and validation of automotive systems
- Fault tolerance and self-checking circuits
- Aging effects on automotive electronics
- Power-up, power-down and periodic test
- System level test
- Functional and structural test generation
- Automotive production testing
- Submission deadline : January 27, 2022
- Notification of acceptance : February 15, 2022
|8:30 - 8:40 CET||Opening|
|8:40 - 9:40 CET||Keynote: From combustion towards electrical cars|
|9:40 - 10:00 CET||Break|
|10:00 - 11:00 CET||Technical Session 1|
|11:00 - 12:00 CET||
Invited Session 1: Design-for-dependability for AI hardware accelerators in the edge
|12:00 - 13:00 CET||Technical Session 2|
|13:00 - 14:30 CET||Lunch break|
|14:30 - 15:30 CET||Technical Session 3|
|15:30 - 16:10 CET||Embedded Tutorial: IEEE P2851 advancements|
|16:10 - 16:30 CET||Break|
|16:30 - 17:30 CET||Invited Session 2: The challenges of reaching zero defect and functional safety – and how the EDA industry tackles them|
|17:30 - 18:30 CET||Panel: What are the limitations of EDA tools with respect to zero defects and FuSa?|
|18:30 - 18:45 CET||Closing|
W01.1 Keynote: From combustion towards electrical cars
Short bio: Riccardo Groppo took his MSc degree in Electronic Engineering at the Politecnico of Torino (Torino, Italy). He is the co-founder and CEO of Ideas & Motion, a high-tech company focused on IP development on silicon and design of complex automotive control systems for niche applications. He is the Chairman of Transportation Working Group and Board Vice-Chairman within EPoSS (European Platform on Smart Systems Integration). He is Member of the Technical Committee in some relevant events worldwide (SAE World Congress, AMAA Conference and Smart System Integration Conference). He started his career with Honeywell Bull and then joined Centro Ricerche FIAT (CRF) in 1989, where he was involved in the design of innovative engine/vehicle automotive control systems. He was a member of the CRF team who developed the first automotive Common Rail system for a direct injection Diesel engine. Then he was involved in the design and industrialization of the MultiAir Technology and the Dry Dual Clutch transmission. He has been the Head of the Automotive Electronics Design and Development Dept. at CRF (2002-2013), where he promoted the design of IP building blocks by means of ASIC technology in cooperation with Freescale Semiconductors and Robert BOSCH for the FIAT/Chrysler applications. Those smart drivers are the standard de-facto in automotive powertrain applications, with volumes exceeding 17 Million parts/year. He holds more 31 patents in the field of automotive electronics and embedded systems, most of which are currently in production on passenger cars.
W01.T1 Technical Session 1 - Applications, Machine Learning, and System-level Test
W01.T1.1 Towards Fast and Efficient Scenario Generation For Autonomous Vehicles
W01.T1.2 Deep Learning Based Driver Model and Fault Detection for Automated Racecar System Testing
W01.T1.3 Unsupervised Clustering of Acoustic Emission Signals for Semiconductor Thin Layer Crack Detection and Damage Event Interpretation
W01.T1.4 Online scheduling of Memory BISTs execution at Real-Time Operating-System level
W01.2 Invited Session 1: Design-for-dependability for AI hardware accelerators in the edge
Abstract: AI has seen an explosion in real-world applications in the recent years. For example, it is the backbone of self-driving and connected cars. The design of AI hardware accelerators to support the intensive and memory-hungry AI workloads is an on-going effort aiming at optimizing the energy-area trade-off. This special session will focus on dependability aspects in the design of AI hardware accelerators. It is often tacitly assumed that neural networks on hardware inherit the remarkable fault tolerance capabilities of the biological brain. This assumption has proven to be false in recent years by a number of fault injection experiments. The three talks will cover reliability assessment and fault tolerance of Artificial Neural Networks and Spiking Neural Networks implemented in hardware, as well as the impact of approximate computing on the fault tolerance capabilities.
- Fault Tolerance of Neural Network Hardware Accelerators for Autonomous Driving
Adrian Evans (CEA-LETI, Grenoble, France), Lorena Anghel (Grenoble-INP, SPINTEC, Grenoble, France), and Stéphane Burel (CEA-LETI, Grenoble, France)
- Exploiting Approximate Computing for Efficient and Reliable Convolutional Neural Networks
Alberto Bosio (École Centrale de Lyon, INL, Lyon, France)
- Reliability Assessment and Fault Tolerance of Spiking Neural Network Hardware Accelerators
Haralampos-G. Stratigopoulos (Sorbonne University, CNRS, LIP6, Paris, France)
W01.2.1 Fault Tolerance of Neural Network Hardware Accelerators for Autonomous Driving
W01.2.2 Exploiting Approximate Computing for Efficient and Reliable Convolutional Neural Networks
W01.2.3 Reliability Assessment and Fault Tolerance of Spiking Neural Network Hardware Accelerators
W01.T2 Technical Session 2 - Testing
W01.T2.1 Perception and Reality Check into V-Stress for Screening Defective Parts in Automotive Reliability
W01.T2.2 Power Cycling Body Diode Current Flow on SiC MOSFET Device
W01.T2.3 Reducing Routing Overhead using Natural Loops
W01.T2.4 A Novel Method for Discovering Electrically Equivalent Defects in Analog/Mixed-Signal Circuits
W01.T3 Technical Session 3 - Reliability and Safety
W01.T3.1 Improving Instruction Cache Memory Reliability under Real-Time constraints
W01.T3.2 Common data language connecting HTOL testing to in-field use
W01.T3.3 Efficient use of on-line LogicBIST to achieve ASIL B in a GPU IP
W01.T3.4 Verification and Validation of Safety Element out of Context
W01.ET Embedded Tutorial - IEEE P2851 advancements
W01.3 Invited Session 2: The challenges of reaching zero defect and functional safety – and how the EDA industry tackles them
Abstract: Automotive Microcontrollers have been becoming very complex System-on-Chips (SoCs). Especially the megatrends Assisted Driving (ADAS) and Automated Driving (AD), but also traditional applications such as power-train steering require ever-increasing functionality. However, these safety-critical environments require zero defect, and the implementation of functional safety measures and the rising complexity poses significant challenges to satisfy these requirements.This special session addresses these challenges and shows potential solutions to overcome them with the help of the EDA industry.
- Automated solutions for safety and security vulnerabilities
Teo Cupaiuolo (Synopsys)
- Functional Safety: an EDA perspective
Alessandra Nardi (Cadence)
- The Zero Defect Goal For Automotive ICs
Lee Harrison (Siemens EDA); Nilanjan Mukherjee (Siemens)
W01.3.1 Automated solutions for safety and security vulnerabilities
W01.3.2 Functional Safety: an EDA perspective
W01.3.3 The Zero Defect Goal For Automotive ICs
W01.4 Panel: What are the limitations of EDA tools with respect to zero defects and FuSa?
Abstract: High quality demanding products segments like automotive, transportation, and aerospace have been characterized by persistent needs across several years:
- Zero defects, or in general very low defective levels
- Accurate modeling and prediction of product reliability
The sustainability of these objectives is challenged by the relentless demand of higher performances products and the consequent access to higher complexities and advanced technology nodes.
Functional safety standards and requirements aim to grant the usability of products in safety-critical applications and add several requirements whose satisfaction is a key criticality during the development of a new product.
The proposed panel session would like to debate with the experts about how much the available EDA tools are effectively helping to face the described challenges.
As an example, these are suitable questions that anyone in the field may need answering:
- How does EDA help effectively resolve “end-to-end” the traceability of defined requirements? Is this representing a sustainable effort?
- Is DFT effective enough in addressing fault models to reach target quality?
- Is verification/simulation/validation effective respect transient mode?