DATE Save the Date 17 to 19 April 2023


Dear DATE community,

We, the DATE Sponsors Committee (DSC) and the DATE Executive Committee (DEC), are deeply shocked and saddened by the tragedy currently unfolding in Ukraine, and we would like to express our full solidarity with all the people and families affected by the war.

Our thoughts also go out to everyone in Ukraine and Russia, whether they are directly or indirectly affected by the events, and we extend our deep sympathy.

We condemn Russia’s military action in Ukraine, which violates international law. And we call on the different governments to take immediate action to protect everyone in that country, particularly including its civilian population and people affiliated with its universities.

Now more than ever, our DATE community must promote our societal values (justice, freedom, respect, community, and responsibility) and confront this situation collectively and peacefully to end this nonsense war.

DATE Sponsors and Executive Committees.


Kindly note that all times on the virtual conference platform are displayed in the user's time zone.

The time zone for all times mentioned at the DATE website is CET – Central Europe Time (UTC+1).

W01 European Automotive Reliability, Test and Safety (eARTS)

Start
End
Important Dates
    Submission Deadline
      Notification of Acceptance
        Final Presentation Material
        Organiser
        Riccardo Cantoro, Politecnico di Torino, Italy
        Web Chair
        Giusy Iaria, Politecnico di Torino, Italy

         

        Information

        Automotive electronics is becoming more and more relevant in the daily life, especially with the advent of the autonomous driving. People will become 100% dependent on the proper operation of the electronic systems. The 2nd European Automotive Reliability, Test and Safety workshop (eARTS) intends to focus on test, reliability, and safety of automotive electronics, including IC design, test development, system-level integration, production testing, in-field test, diagnosis and repair solutions, cybersecurity, as well as architectures and methods for reliable, safe, and secure operation in the field.

        The eARTS Workshop wants to offer a forum for industry specialists and academic researchers to present and discuss these challenges and emerging solutions. For this second edition in the frame of the DATE conference, special focus will be given on Design-for-Test solutions and System level test.

        Topic Areas – You are invited to participate and submit your contributions to the eARTS Workshop. The workshop’s areas of interest include (but are not limited to) the following topics:

        • Automotive Design-for-Test: enable high quality at low cost
        • Statistical post-processing, Machine Learning, and AI for test and reliability
        • Latent defect activation during production testing
        • Built-In Self-Test in automotive systems: digital, analog, mixed-signal
        • Reuse of test infrastructure and New Product Development acceleration
        • Dependability challenges of autonomous driving and e-mobility
        • Functional safety and cyber-security
        • Automotive standards and certification – ISO 26262, AEC-Q100
        • Approximate computing for automotive
        • Verification and validation of automotive systems
        • Fault tolerance and self-checking circuits
        • Aging effects on automotive electronics
        • Power-up, power-down and periodic test
        • System level test
        • Functional and structural test generation
        • Automotive production testing

        Key dates

        • Submission deadline : January 27, 2022
        • Notification of acceptance : February 15, 2022

        Program

         

        Morning sessions

        8:30 - 8:40 CET Opening
        8:40 - 9:40 CET Keynote: From combustion towards electrical cars
        9:40 - 10:00 CET Break
        10:00 - 11:00 CET Technical Session 1
        11:00 - 12:00 CET

        Invited Session 1: Design-for-dependability for AI hardware accelerators in the edge

        12:00 - 13:00 CET Technical Session 2
        13:00 - 14:30 CET Lunch break

         

         

        Afternoon sessions

        14:30 - 15:30 CET Technical Session 3
        15:30 - 16:10 CET Embedded Tutorial: IEEE P2851 advancements 
        16:10 - 16:30 CET Break
        16:30 - 17:30 CET Invited Session 2: The challenges of reaching zero defect and functional safety – and how the EDA industry tackles them
        17:30 - 18:30 CET Panel: What are the limitations of EDA tools with respect to zero defects and FuSa?
        18:30 - 18:45 CET Closing

         

         

        W01.0 Opening

        Session Start
        Session End
        Chair
        Paolo Bernardi, Politecnico di Torino, Italy
        Chair
        Yervant Zorian, Synopsys, United States
        Chair
        Riccardo Cantoro, Politecnico di Torino, Italy
        Chair
        Wim Dobbelaere, onsemi, Belgium

        W01.1 Keynote: From combustion towards electrical cars

        Session Start
        Session End
        Keynote Speaker
        Riccardo Groppo, Ideas and Motion, Italy
        Moderator
        Paolo Bernardi, Politecnico di Torino, Italy

        Short bio: Riccardo Groppo took his MSc degree in Electronic Engineering at the Politecnico of Torino (Torino, Italy). He is the co-founder and CEO of Ideas & Motion, a high-tech company focused on IP development on silicon and design of complex automotive control systems for niche applications. He is the Chairman of Transportation Working Group and Board Vice-Chairman within EPoSS (European Platform on Smart Systems Integration). He is Member of the Technical Committee in some relevant events worldwide (SAE World Congress, AMAA Conference and Smart System Integration Conference). He started his career with Honeywell Bull and then joined Centro Ricerche FIAT (CRF) in 1989, where he was involved in the design of innovative engine/vehicle automotive control systems. He was a member of the CRF team who developed the first automotive Common Rail system for a direct injection Diesel engine. Then he was involved in the design and industrialization of the MultiAir Technology and the Dry Dual Clutch transmission. He has been the Head of the Automotive Electronics Design and Development Dept. at CRF (2002-2013), where he promoted the design of IP building blocks by means of ASIC technology in cooperation with Freescale Semiconductors and Robert BOSCH for the FIAT/Chrysler applications. Those smart drivers are the standard de-facto in automotive powertrain applications, with volumes exceeding 17 Million parts/year. He holds more 31 patents in the field of automotive electronics and embedded systems, most of which are currently in production on passenger cars.

        W01.T1 Technical Session 1 - Applications, Machine Learning, and System-level Test

        Session Start
        Session End
        Moderator
        Paolo Rech, University of Trento, Italy
        Presentations

        W01.T1.1 Towards Fast and Efficient Scenario Generation For Autonomous Vehicles

        Start
        End
        Speaker
        Haolan Liu, University of California, United States

        W01.T1.2 Deep Learning Based Driver Model and Fault Detection for Automated Racecar System Testing

        Start
        End
        Speaker
        Yousef Abdulhammed, BMW Motorsport, Germany

        W01.T1.3 Unsupervised Clustering of Acoustic Emission Signals for Semiconductor Thin Layer Crack Detection and Damage Event Interpretation

        Start
        End
        Speaker
        Sarah Seifi, Infineon Technologies AG, Germany

        W01.T1.4 Online scheduling of Memory BISTs execution at Real-Time Operating-System level

        Start
        End
        Speaker
        Paolo Bernardi, Politecnico di Torino, Italy

        W01.2 Invited Session 1: Design-for-dependability for AI hardware accelerators in the edge

        Session Start
        Session End
        Organiser
        Haralampos-G. Stratigopoulos, Sorbonne Universités, CNRS, LIP6, France
        Moderator
        Marcello Traiola, LIRMM, France

        Abstract: AI has seen an explosion in real-world applications in the recent years. For example, it is the backbone of self-driving and connected cars. The design of AI hardware accelerators to support the intensive and memory-hungry AI workloads is an on-going effort aiming at optimizing the energy-area trade-off. This special session will focus on dependability aspects in the design of AI hardware accelerators.  It is often tacitly assumed that neural networks on hardware inherit the remarkable fault tolerance capabilities of the biological brain. This assumption has proven to be false in recent years by a number of fault injection experiments. The three talks will cover reliability assessment and fault tolerance of Artificial Neural Networks and Spiking Neural Networks implemented in hardware, as well as the impact of approximate computing on the fault tolerance capabilities.

        Presentations:

        • Fault Tolerance of Neural Network Hardware Accelerators for Autonomous Driving
          Adrian Evans (CEA-LETI, Grenoble, France), Lorena Anghel (Grenoble-INP, SPINTEC, Grenoble, France), and Stéphane Burel (CEA-LETI, Grenoble, France)
        • Exploiting Approximate Computing for Efficient and Reliable Convolutional Neural Networks
          Alberto Bosio (École Centrale de Lyon, INL, Lyon, France)
        • Reliability Assessment and Fault Tolerance of Spiking Neural Network Hardware Accelerators
          Haralampos-G. Stratigopoulos (Sorbonne University, CNRS, LIP6, Paris, France)
        Presentations

        W01.2.1 Fault Tolerance of Neural Network Hardware Accelerators for Autonomous Driving

        Start
        End
        Speaker
        Adrian Evans, CEA-LETI, France

        W01.2.2 Exploiting Approximate Computing for Efficient and Reliable Convolutional Neural Networks

        Start
        End
        Speaker
        Alberto Bosio, École Centrale de Lyon, France

        W01.2.3 Reliability Assessment and Fault Tolerance of Spiking Neural Network Hardware Accelerators

        Start
        End
        Speaker
        Haralampos-G. Stratigopoulos, Sorbonne Universités, CNRS, LIP6, France

        W01.T2 Technical Session 2 - Testing

        Session Start
        Session End
        Moderator
        Melanie Schillinsky, NXP, Germany
        Presentations

        W01.T2.1 Perception and Reality Check into V-Stress for Screening Defective Parts in Automotive Reliability

        Start
        End
        Speaker
        Lieyi Sheng, onsemi, Belgium

        W01.T2.2 Power Cycling Body Diode Current Flow on SiC MOSFET Device

        Start
        End
        Speaker
        Giovanni Corrente, STMicroelectronics, Italy

        W01.T2.3 Reducing Routing Overhead using Natural Loops

        Start
        End
        Speaker
        Tobias Kilian, TU Munich / Infineon Technologies AG, Germany

        W01.T2.4 A Novel Method for Discovering Electrically Equivalent Defects in Analog/Mixed-Signal Circuits

        Start
        End
        Speaker
        Mayukh Bhattacharya , Synopsys, United States

        W01.T3 Technical Session 3 - Reliability and Safety

        Session Start
        Session End
        Moderator
        Michelangelo Grosso, STMicroelectronics, Italy
        Presentations

        W01.T3.1 Improving Instruction Cache Memory Reliability under Real-Time constraints

        Start
        End
        Speaker
        Fabien Bouquillon , Université de Lille, France

        W01.T3.2 Common data language connecting HTOL testing to in-field use

        Start
        End
        Speaker
        Marc Hutner , proteanTecs, Canada

        W01.T3.3 Efficient use of on-line LogicBIST to achieve ASIL B in a GPU IP

        Start
        End
        Speaker
        Lee Harrison, Siemens EDA, United Kingdom

        W01.T3.4 Verification and Validation of Safety Element out of Context

        Start
        End
        Speaker
        Shivakumar Chonnad , Synopsys Inc, United States

        W01.ET Embedded Tutorial - IEEE P2851 advancements

        Session Start
        Session End
        Organiser
        Jyotika Athavale , NVIDIA, United States
        Moderator
        Oscar Ballan , Ethernovia, United States
        Speaker
        Bernhard Bauer, Synopsys, Denmark
        Speaker
        Meirav Nitzan , Synopsys, United States

        W01.3 Invited Session 2: The challenges of reaching zero defect and functional safety – and how the EDA industry tackles them

        Session Start
        Session End
        Organiser
        Riccardo Cantoro, Politecnico di Torino, Italy
        Organiser
        Daniel Tille, Infineon, Germany
        Moderator
        Daniel Tille, Infineon, Germany

        Abstract: Automotive Microcontrollers have been becoming very complex System-on-Chips (SoCs). Especially the megatrends Assisted Driving (ADAS) and Automated Driving (AD), but also traditional applications such as power-train steering require ever-increasing functionality. However, these safety-critical environments require zero defect, and the implementation of functional safety measures and the rising complexity poses significant challenges to satisfy these requirements.This special session addresses these challenges and shows potential solutions to overcome them with the help of the EDA industry.

        Presentations:

        • Automated solutions for safety and security vulnerabilities

        Teo Cupaiuolo (Synopsys)

        • Functional Safety: an EDA perspective

        Alessandra Nardi (Cadence)

        • The Zero Defect Goal For Automotive ICs

        Lee Harrison (Siemens EDA); Nilanjan Mukherjee (Siemens)

        Presentations

        W01.3.1 Automated solutions for safety and security vulnerabilities

        Start
        End
        Speaker
        Teo Cupaiuolo, Synopsis, Italy

        W01.3.2 Functional Safety: an EDA perspective

        Start
        End
        Speaker
        Alessandra Nardi, Cadence, United States

        W01.3.3 The Zero Defect Goal For Automotive ICs

        Start
        End
        Speaker
        Lee Harrison, Siemens EDA, United Kingdom

        W01.4 Panel: What are the limitations of EDA tools with respect to zero defects and FuSa?

        Session Start
        Session End
        Organiser
        Davide Appello, STMicroelectronics, Italy
        Moderator
        Wim Dobbelaere, onsemi, Belgium
        Panellist
        Antonio Priore, ARM, United Kingdom
        Panellist
        Georges Gielen, KU Leuven, Belgium
        Panellist
        Chen He, NXP, United States
        Panellist
        Mauro Pipponzi, ELES, Italy
        Panellist
        Vladimir Zivkovic, Infineon, Denmark
        Panellist
        Om Ranjan , STMicroelectronics, India

        Abstract: High quality demanding products segments like automotive, transportation, and aerospace have been characterized by persistent needs across several years:

        • Zero defects, or in general very low defective levels
        • Accurate modeling and prediction of product reliability

        The sustainability of these objectives is challenged by the relentless demand of higher performances products and the consequent access to higher complexities and advanced technology nodes.
        Functional safety standards and requirements aim to grant the usability of products in safety-critical applications and add several requirements whose satisfaction is a key criticality during the development of a new product.

        The proposed panel session would like to debate with the experts about how much the available EDA tools are effectively helping to face the described challenges.
        As an example, these are suitable questions that anyone in the field may need answering:

        • How does EDA help effectively resolve “end-to-end” the traceability of defined requirements? Is this representing a sustainable effort?
        • Is DFT effective enough in addressing fault models to reach target quality?
        • Is verification/simulation/validation effective respect transient mode?

        W01.5 Closing

        Session Start
        Session End
        Chair
        Paolo Bernardi, Politecnico di Torino, Italy
        Chair
        Riccardo Cantoro, Politecnico di Torino, Italy
        Chair
        Yervant Zorian, Synopsys, United States
        Chair
        Wim Dobbelaere, onsemi, Belgium